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Clip

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JTAG Live's Clip module allows you to create more complex vector-based cluster test sequences.  Each vector in a sequence contains a set of drive values for device inputs and the corresponding sensed values on the device outputs. Clip's logic analyzer-like waveform display shows you the I/O vectors, and by storing the sequence for a known-good board, you can actually create a test for boards of the same type, which is extremely useful when you need to debug multiple prototypes.

 

Using Clip you can set-up vector sets in Hex, Binary and Decimal formats for many types of debug applications such as  Flash ID-code testing or testing I2C  and SPI bus protocol parts. If you can access the critical signals of your device with boundary-scan enabled pins then you can most likely test it with Clip. Vector sets can be up to unlimited patterns long and with no limit to the number of pins used. Built in vector generation modes include, Walk 1, Walk 0 and Binary count.