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JT 2111/MPV
$1,610.00
The JT 2111/MPV is a digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
- Compact multi-purpose system
- Adds testing possibilities
- Ready to be shipped to USA and EU
At this moment the delivery time for this product is 16 weeks.
About JT 2111/MPV
- Compact 64 channel I/O system in rugged housing
- Choice of connector options (DIN or IDC)
- Supports high clock (TCK frequencies)
- Backwards compatible with JT 2111/LV
- TAP-IN, TAP-OUT feature allows daisy-chaining with UUT or other DIOS
JT2111/MPV can be used to extend fault coverage in benchtop or experimental test and board debug set-ups. Equally the unit can be enclosed with a production test fixture solution for volume testing. The 64 I/Os are grouped in four segments of 16 pins. Each segment can be bypassed in order to shorten the chain, thereby providing faster programming of flash devices.
The JT 2111/MPV derives its power from an AC adaptor. The input power supply voltage is hardware or software selectable at 1.5V, 1.8V, 2.5V or 3.3V. If 3.3V is selected, the voltage input is 5V tolerant.
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- 64 channels of digital I/O voltage selectable via rotary switch
- Supports 3.3V (5V tolerant), 2.5V, 1.8V, 1.5V
- Choice of connector options (DIN or IDC)
- 200mA supply voltage for accessories
Form factors:
- JT 2111/MPV–DIN: Equipped with a single 96-pin DIN 41612 connector
- JT 2111/MPV–IDC: Equipped with four 20-pin 0.1″ pitch IDC connectors
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